Alternative Reliable Digit Span and WAIS-IV Digit Span Scaled Scores as Measures of Malingering

Event Name/Location

37th Annual National Academy of Neuropsychology (NAN) Conference

Event Location / Date(s)

Boston, Massachusetts

Presentation Date

10-25-2017

Document Type

Poster

Presenter(s)/Author(s)

Chris Burley, Nova Southeastern University
Huda Abu-Suwa, Nova Southeastern University
Ashleigh Lupton, Nova Southeastern University
Andrew Grego, Nova Southeastern University
Charles Golden, Nova Southeastern UniversityFollow

Description

Objective: To examine the diagnostic accuracies of an alternative Reliable Digital Scan (RDS) measure including the digits forward and sequencing tasks from the Wechsler Adult Intelligence Scale-IV (WAIS-IV) and the WAIS-IV Digit Span Scaled Score (DS-SS) relative to performance validity as determined by trials 2 and 3 of the Test of Memory Malingering (TOMM) in a diagnostically diverse sample.

NSUWorks Citation

Burley, C., Abu-Suwa, H., Lupton, A., Grego, A., Golden, C. (2017). Alternative Reliable Digit Span and WAIS-IV Digit Span Scaled Scores as Measures of Malingering. 37th Annual National Academy of Neuropsychology (NAN) Conference.
Available at: https://nsuworks.nova.edu/cps_facpresentations/3592