Disorder Characterization of Oxide/Silicon Interfaces from I-V Curves
In this paper, we present results on transmission-energy curves through quantum wells with disordered interfaces. We propose a rule to process experimental data to obtain information about the degree of disorder.
Nemzer, Louis R. and Zypman, Fredy R., "Disorder Characterization of Oxide/Silicon Interfaces from I-V Curves" (2003). Chemistry and Physics Faculty Articles. 85.