Chemistry and Physics Faculty Articles

Title

Disorder Characterization of Oxide/Silicon Interfaces from I-V Curves

Document Type

Article

Publication Date

2003

Publication Title

MRS Proceedings

ISSN

1946-4274

Volume

786

Abstract

In this paper, we present results on transmission-energy curves through quantum wells with disordered interfaces. We propose a rule to process experimental data to obtain information about the degree of disorder.

DOI

10.1557/PROC-786-E3.1

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